Course modules

Module 5. - Characterization II: Advanced Microscopies (6 ECTS credits)

Scanning Electron Microscopy, SEM. Transmission Electron Microscopy, TEM (image and diffraction). Analytical techniques related to the electron microscopies. Atomic Force Microscopy and Magnetic Force Microscopy. Scanning Tunneling Microscopy.

Lab demonstrations

 

Master Degree in Nanostructured Materials for Nanotechnology Applications / University of Zaragoza