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Course modules

Module 5. - Characterization II: Advanced Microscopies (6 ECTS credits)

Introduction to electron microscopies and local probe microscopies. Scanning Electron Microscopy. Transmission Electron Microscopy. Atomic Force Microscopy and Magnetic Force Microscopy. Scanning Tunneling Microscopy. Dual-Beam Microscopies: image, etching, and nanolithography deposition. Other advanced optical microscopies: confocal microscopy and near-field scanning optical microscopy.

Lab demonstrations

 

Master Degree in Nanostructured Materials for Nanotechnology Applications / University of Zaragoza